推荐同事 机构合作 中文 繁體中文 English 한국어 日本語 Português Español

美国ACCDON公司旗下品牌

021-33361733,021-33632861

chinasupport@letpub.com

登录 注册 新注册优惠

MICROELECTRONIC ENGINEERING

2023年12月最新中科院分区表数据已经更新,欢迎查询! 如果您对期刊系统有任何需求或者问题,欢迎点击此处反馈给我们。

按期刊名首写字母查看 MICROELECTRON E最新评论:10.18投稿; 1.22反馈拒稿,但是可根据审稿意见大修后重投; 1.30重新提交; 2.3号接收。 (2024-02-04)


期刊名:   ISSN:   研究方向:   影响因子: -   SCI收录:
大类学科:   小类学科:   中科院分区:   是否OA期刊:   结果排序:

同行评审状态查询 Manuscript Number * Last Name * First Name * 出版社 * 查 询 重 置

按研究方向查看:


MICROELECTRONIC ENGINEERING期刊基本信息Hello,您是该期刊的第76228位访客

基本信息 登录收藏
期刊名字MICROELECTRONIC ENGINEERINGMICROELECTRONIC ENGINEERING

MICROELECTRON ENG
(此期刊被最新的JCR期刊SCIE收录)

LetPub评分
5.4
57人评分
我要评分

声誉
6.3

影响力
4.3

速度
6.9

期刊ISSN0167-9317
微信扫码收藏此期刊
2022-2023最新影响因子
(数据来源于搜索引擎)
2.3 点击查看影响因子趋势图
实时影响因子 截止2023年12月27日:2.18
2022-2023自引率4.30%点击查看自引率趋势图
五年影响因子2.3
h-index 89
CiteScore
CiteScoreSJRSNIPCiteScore排名
5.500.4670.859
学科分区排名百分位
大类:Engineering
小类:Electrical and Electronic Engineering
Q2199 / 738
大类:Engineering
小类:Condensed Matter Physics
Q2117 / 423
大类:Engineering
小类:Atomic and Molecular Physics, and Optics
Q260 / 211
大类:Engineering
小类:Surfaces, Coatings and Films
Q238 / 131
大类:Engineering
小类:Electronic, Optical and Magnetic Materials
Q282 / 271

期刊简介
Microelectronic Engineering is the premier nanoprocessing, and nanotechnology journal focusing on fabrication of electronic, photonic, bioelectronic, electromechanic and fluidic devices and systems, and their applications in the broad areas of electronics, photonics, energy, life sciences, and environment. It covers also the expanding interdisciplinary field of "more than Moore" and "beyond Moore" integrated nanoelectronics / photonics and micro-/nano-/bio-systems. Through its unique mixture of peer-reviewed articles, reviews, accelerated publications, short and Technical notes, and the latest research news on key developments, Microelectronic Engineering provides comprehensive coverage of this exciting, interdisciplinary and dynamic new field for researchers in academia and professionals in industry.
期刊官方网站http://www.journals.elsevier.com/microelectronic-engineering/
期刊投稿网址https://www.editorialmanager.com/MEE
期刊语言要求Language
Please write your text in good English (American or British usage is accepted, but not a mixture of these). Authors who feel their English language manuscript may require editing to eliminate possible grammatical or spelling errors and to conform to correct scientific English may wish to use the English Language Editing service.

经LetPub语言功底雄厚的美籍native English speaker精心编辑的稿件,不仅能满足MICROELECTRONIC ENGINEERING的语言要求,还能让MICROELECTRONIC ENGINEERING编辑和审稿人得到更好的审稿体验,让稿件最大限度地被MICROELECTRONIC ENGINEERING编辑和审稿人充分理解和公正评估。LetPub的专业SCI论文编辑服务(包括SCI论文英语润色同行资深专家修改润色SCI论文专业翻译SCI论文格式排版专业学术制图等)帮助作者准备稿件,已助力全球15万+作者顺利发表论文。部分发表范例可查看:服务好评 论文致谢
提交文稿
是否OA开放访问No
通讯方式ELSEVIER SCIENCE BV, PO BOX 211, AMSTERDAM, NETHERLANDS, 1000 AE
出版商Elsevier
涉及的研究方向工程技术-工程:电子与电气
出版国家或地区NETHERLANDS
出版语言English
出版周期Monthly
出版年份1983
年文章数 118点击查看年文章数趋势图
Gold OA文章占比3.41%
研究类文章占比:
文章 ÷(文章 + 综述)
90.68%
WOS期刊SCI分区
2022-2023年最新版
WOS分区等级:3区

按学科分区JIF分区JIF排名JIF百分位
学科:ENGINEERING, ELECTRICAL & ELECTRONIC
类别:SCIE
Q3162/275
学科:NANOSCIENCE & NANOTECHNOLOGY
类别:SCIE
Q482/107
学科:OPTICS
类别:SCIE
Q359/100
学科:PHYSICS, APPLIED
类别:SCIE
Q392/159
中科院《国际期刊预警
名单(试行)》名单
2024年02月发布的2024版:不在预警名单中

2023年01月发布的2023版:不在预警名单中

2021年12月发布的2021版:不在预警名单中

2020年12月发布的2020版:不在预警名单中
中科院SCI期刊分区
2023年12月最新升级版
点击查看中科院SCI期刊分区趋势图
大类学科小类学科Top期刊综述期刊
工程技术 4区4区3区
ENGINEERING, ELECTRICAL & ELECTRONIC
工程:电子与电气
3区4区4区
NANOSCIENCE & NANOTECHNOLOGY
纳米科技
2区3区4区
OPTICS
光学
1区1区4区
PHYSICS, APPLIED
物理:应用
3区2区4区
中科院SCI期刊分区
2022年12月升级版
大类学科小类学科Top期刊综述期刊
工程技术 3区3区1区
OPTICS
光学
3区1区3区
PHYSICS, APPLIED
物理:应用
3区2区3区
ENGINEERING, ELECTRICAL & ELECTRONIC
工程:电子与电气
3区4区4区
NANOSCIENCE & NANOTECHNOLOGY
纳米科技
4区1区4区
中科院SCI期刊分区
2021年12月旧的升级版
大类学科小类学科Top期刊综述期刊
工程技术 4区3区2区
OPTICS
光学
4区4区3区
PHYSICS, APPLIED
物理:应用
4区4区3区
ENGINEERING, ELECTRICAL & ELECTRONIC
工程:电子与电气
3区2区4区
NANOSCIENCE & NANOTECHNOLOGY
纳米科技
1区4区4区
SCI期刊收录coverage Science Citation Index Expanded (SCIE) (2020年1月,原SCI撤销合并入SCIE,统称SCIE)
Scopus (CiteScore)
PubMed Central (PMC)链接http://www.ncbi.nlm.nih.gov/nlmcatalog?term=0167-9317%5BISSN%5D
平均审稿速度网友分享经验:
平均6.0个月
平均录用比例网友分享经验:
容易
LetPub助力发表经LetPub编辑的稿件平均录用比例是未经润色的稿件的1.5倍,平均审稿时间缩短40%。众多作者在使用LetPub的专业SCI论文编辑服务(包括SCI论文英语润色同行资深专家修改润色SCI论文专业翻译SCI论文格式排版专业学术制图等)后论文在MICROELECTRONIC ENGINEERING顺利发表。
快看看作者怎么说吧:服务好评 论文致谢
在线出版周期来源Elsevier官网:
平均3.3周
期刊常用信息链接
同领域相关期刊 MICROELECTRONIC ENGINEERING期刊近年CiteScore指标趋势图
该杂志的自引率趋势图 MICROELECTRONIC ENGINEERING中科院SCI期刊分区趋势图
该杂志的年文章数趋势图 同领域作者分享投稿经验
MICROELECTRONIC ENGINEERING上中国学者近期发表的论文  
  • 同领域相关期刊
  • 期刊CiteScore趋势图
  • 期刊自引率趋势图
  • 中科院SCI期刊分区趋势图
  • 年文章数趋势图
  • 该期刊中国学者近期发表论文
  • 中科院SCI期刊分区相关期刊
  • 同类著名期刊名称 h-index CiteScore
    IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE32630.40
    PROCEEDINGS OF THE IEEE25031.60
    IEEE SIGNAL PROCESSING MAGAZINE15522.40
    IEEE TRANSACTIONS ON FUZZY SYSTEMS17019.00
    PROGRESS IN QUANTUM ELECTRONICS5815.60
    IEEE TRANSACTIONS ON IMAGE PROCESSING24218.20
    IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING14812.40
    EXPERT SYSTEMS WITH APPLICATIONS16212.60
    IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS11211.60
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY15411.20
    中科院SCI期刊分区同大类学科的热搜期刊 浏览次数
    Chemical Engineering Journal3256515
    Energy1291209
    Fuel1254418
    APPLIED ENERGY1174686
    Construction and Building Materials1015557
    JOURNAL OF POWER SOURCES947562
    INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH932760
    MEASUREMENT864217
    INTERNATIONAL JOURNAL OF HYDROGEN ENERGY856703
    ENERGY & FUELS821711
  •  

    MICROELECTRONIC ENGINEERING MICROELECTRONIC ENGINEERING
    我来预测明年:
    稳步上升 表现平稳 逐渐下降  刷新
  •  

     
  •  

     
  •  

     
  • 中国学者近期发表的论文
    1.Investigation of trapping/de-trapping dynamics of surface states in AlGaN/GaN high-electron mobility transistors based on dual-gate structures

    Author: Luan, Tiantian; Jiang, Qimeng; Huang, Sen; Wang, Xinhua; Jin, Hao; Guo, Fuqiang; Yao, Yixu; Fan, Jie; Yin, Haibo; Wei, Ke; Li, Yankui; Jiang, Haojie; Li, Junfeng; Liu, Xinyu
    Journal: MICROELECTRONIC ENGINEERING. 2023; Vol. 269, Issue , pp. -. DOI: 10.1016/j.mee.2022.111916
        DOI
    2.Soybean-based memristor for multilevel data storage and emulation of synaptic behavior

    Author: Wang, Lu; Li, Wenhao; Wen, Dianzhong
    Journal: MICROELECTRONIC ENGINEERING. 2023; Vol. 267, Issue , pp. -. DOI: 10.1016/j.mee.2022.111911
        DOI
    3.La-doped BiFeO3 junction based random access multilevel nonvolatile memory

    Author: Li, Dong; Zhu, Xiaodong; Wu, Yanan; Zhao, Jian; Zhang, Kaimin; Li, Rui; Hao, Danni; Ma, Yanqing; Moro, Ramiro; Ma, Lei
    Journal: MICROELECTRONIC ENGINEERING. 2023; Vol. 267, Issue , pp. -. DOI: 10.1016/j.mee.2022.111908
        DOI
    4.A dual-mass fully decoupled MEMS gyroscope with optimized structural design for minimizing mechanical quadrature coupling

    Author: Wu, Zhongye; Feng, Ronghui; Sun, Chengliang; Wang, Peng; Wu, Guoqiang
    Journal: MICROELECTRONIC ENGINEERING. 2023; Vol. 269, Issue , pp. -. DOI: 10.1016/j.mee.2022.111918
        DOI
    5.Dynamical analysis, circuit implementation, and simultaneous application of a novel four-dimensional hyperchaotic system based on cosine functions

    Author: Zhang, Jie; Hou, Jinyou; Xu, Longhao; Zhu, Xiaopeng; Xie, Qinggang
    Journal: MICROELECTRONIC ENGINEERING. 2023; Vol. 271, Issue , pp. -. DOI: 10.1016/j.mee.2023.111939
        DOI
    6.Machine learning algorithm for the structural design of MEMS resonators

    Author: Gu, Liutao; Zhang, Weiping; Lu, Haolin; Wu, Yuting; Fan, Chongyang
    Journal: MICROELECTRONIC ENGINEERING. 2023; Vol. 271, Issue , pp. -. DOI: 10.1016/j.mee.2023.111950
        DOI
    7.The insight and evaluation of ultra-scaled sub-1 nm gate length transistors

    Author: Tian, He; Shen, Yang; Yan, Zhaoyi; Liu, Yanming; Wu, Fan; Ren, Tian-Ling
    Journal: MICROELECTRONIC ENGINEERING. 2023; Vol. 273, Issue , pp. -. DOI: 10.1016/j.mee.2023.111963
        DOI
    8.Simulation study of zone-height limit by electron beam lithography for 30 nm Fresnel zone plates in X ray optics

    Author: Chen, Qiucheng; Mu, Chengyang; Tong, Xujie; Zhao, Jun; Wu, Qingxin; Chen, Yifang
    Journal: MICROELECTRONIC ENGINEERING. 2023; Vol. 273, Issue , pp. -. DOI: 10.1016/j.mee.2023.111965
        DOI
    9.A study of structural effect on the spectral property of metallic cross-hole array in mid-infrared wavelengths

    Author: Guo, Jinyu; Liu, Tao; Tian, Shuoqiu; Yuan, Wentao; Zheng, Rui; Wu, Shan; Zhao, Ding; Chen, Yifang; Qiu, Min
    Journal: MICROELECTRONIC ENGINEERING. 2023; Vol. 274, Issue , pp. -. DOI: 10.1016/j.mee.2023.111966
        DOI
    10.Generation of inverse assist features using generative adversarial networks

    Author: Cao, Qingchen; Xu, Peng; Sun, Song; Shi, Jiangliu; Wei, Yayi
    Journal: MICROELECTRONIC ENGINEERING. 2023; Vol. 273, Issue , pp. -. DOI: 10.1016/j.mee.2023.111951
        DOI
  • 同大类学科的其他著名期刊名称 h-index CiteScore
    Nature Electronics038.30
    PROGRESS IN ENERGY AND COMBUSTION SCIENCE16159.00
    Annual Review of Fluid Mechanics16352.90
    IEEE Reviews in Biomedical Engineering027.80
    TRENDS IN BIOTECHNOLOGY19531.30
    Advanced Fiber Materials012.50
    BIOTECHNOLOGY ADVANCES16127.10
    RENEWABLE & SUSTAINABLE ENERGY REVIEWS22226.30
    Chemical Engineering Journal17221.50
    IEEE SIGNAL PROCESSING MAGAZINE15522.40
    同分区等级的其他期刊名称 h-index CiteScore
    HARVARD BUSINESS REVIEW02.40
    QJM-AN INTERNATIONAL JOURNAL OF MEDICINE1086.10
    Energy Material Advances08.50
    CLINICAL AND EXPERIMENTAL HYPERTENSION453.60
    Journal of Public Transportation07.00
    Asian Journal of Psychiatry010.90
    Chinese Journal of Population Resources and Environment02.60
    VIEW08.60
    HLA933.00
    INTERNATIONAL JOURNAL OF SOCIAL PSYCHIATRY011.50


以上SCI期刊相关数据和信息来源于网络,仅供参考。
投稿状态统计: 我要评分:

    同领域作者分享投稿经验:共12条 (包含回复)

我来分享

    联系我们 | 站点地图 | 友情链接 | 授权代理商 | 加入我们

    © 2010-2024 中国: LetPub上海分公司    网站备案号:沪ICP备10217908号-1    沪公网安备号:31010402006960

    增值电信业务经营许可证:沪B2-20211595

    礼翰商务信息咨询(上海)有限公司      办公地址:上海市徐汇区漕溪北路88号圣爱大厦1803室

    United States: Tel: 1-781-202-9968 Address: 400 5th Ave, Suite 530, Waltham, Massachusetts 02451